Online Service
Wechat
TOP
img001@1920x440.jpg img002@750x500.jpg
Quality Management System

Reliability Experiment

01
High Temperature Reverse Bias Test(HTRB)
img001@1000x1237.jpg
Testing Time(Plan) Testing Time(Plan) Sample QTY(PCS)
New product development 1000 77*3 (According to AEC-Q101)
Annual test 1000 77
New material confirmation 168 77
Monthly reliability monitoring 168 22


  • Test Type:Environmental (temperature) electrical stress composite verification
  • Test Purpose:Verify the reverse working ability of chip under high temperature 
  • Test reference standard: GB/T 4023、JESD22-A108
  • Test Conditions: VR(VZ)=80%*VRMAX,TA=TJ±5℃
  • Test equipment:High Temperature Reverse Bias Test system (HTRB system)
02
Intermittent Operating Life test
间歇寿命试验测试.png
Testing Time(Plan) Testing Cycles(cycle) Sample QTY(PCS)
New product development 7500 77*3 (According to AEC-Q101)
New material confirmation 1000 77
Monthly reliability monitoring 1000 22
 IQC (incoming quality control inspection) 1000 10


  • Test Type:Electrical stress testing
  • Test Purpose:Verify the comprehensive performance of the product in intermittent operation                                          
  • Test reference standard: MIL-STD-75 is equivalent to AEC-Q101-Rev-D1
  • Test Conditions: ΔTj≥100℃,2min ON/2mil OFF 
  • Test equipment:Intermittent operating life test system
03
Operating Life Test
工作寿命试验测试.png
Testing Time(Plan) Testing Cycles(H) Sample QTY(PCS)
New product development 1000 77*3
New material confirmation 168 77
Monthly reliability monitoring 168 22

IQC (incoming quality control inspection)

168 10
  • Test Type:Electrical stress verification 
  • Test Purpose:Verify the comprehensive performance of product under rated current (power)
  • Test reference standard: GB/T 4023/JESD 22-A-108
  • Test Conditions:Add voltage and current to the tested sample, and the product is equal to Ptot.   
  • Test equipment:Diode Constant Current burn-in test system
04
ESD Test
抗静电能力试验.png
Testing Time(Plan) Testing Cycles (Times) Sample QTY(PCS)
New product development Positive and negative electrodes 5 times each 30*1 (According to AEC-Q101)
Annual test Positive and negative electrodes 5 times each 30
New material confirmation Positive and negative electrodes 5 times each 22
Monthly reliability monitoring Positive and negative electrodes 5 times each 22
  • Test Type:Electrical stress verification 
  • Test Purpose:Verify the anti-static ability of the product chip
  • Test reference standard:JESD22-A114-A (HBM);JESD22-A115-A(MM)
  • Test Conditions:RH=30-60%,TA=10-35℃ According to specifications
  • Test equipment:Electrostatic discharge generators
05
Peak Forward Surge Current Test
浪涌电流测试.png
Testing Time(Plan) Testing Cycles(mS) Testing Cycles(mS)
New product development 8.3mS 77
Annual test 8.3mS 77
New material confirmation 8.3mS 40
Monthly reliability monitoring 8.3mS 40
  • Test Type:Electrical stress verification
  • Test Purpose:Verify the forward surge current capability of product
  • Test reference standard: Internal specification testing (destructive)
  • Test Conditions: T=8.3mS(Or specially formulated test waveforms and times)
  • Test equipment:Surge Generator
06
High Temperature Storage Test
高温贮存试验.png
Testing Time(Plan) Testing Cycles(H) Sample QTY(PCS)
New product development 1000 77*3 (According to AEC-Q101)
Annual test 1000 77
New material confirmation 168 77
Monthly reliability monitoring 168 22
  • Test Type:Environmental Stress verification
  • Test Purpose:Verify the product's storage capacity at high temperatures
  • Test reference standard:GB/T 4937.6-2012 is equivalent to IEC 60749-6:2002
  • Test Conditions: TA=TstgMax±5℃(150℃)
  • Test equipment:Temperature Test Chambers
07
Low Temperature Storage Test
低温贮存试验.png
Testing Time(Plan) Testing Cycles(H) Sample QTY(PCS)
New product development 1000 77*3 (According to AEC-Q101)
Annual test 1000 77
New material confirmation 168 77
Monthly reliability monitoring 168 22
  • Test Type:Environmental Stress verificationx
  • Test Purpose:Verify the product's storage capacity at low temperatures
  • Test reference standard: MIL-STD-810F
  • Test Conditions: TA=-55℃±5℃
  • Test equipment: Low Temperature Test Chambers
08
Constant Temperature/Humidity Storage Test
恒温恒湿存储试验.png
Testing Time(Plan) Testing Cycles(H) Sample QTY(PCS)
New product development 1000 77*3 (According to AEC-Q101)
Annual test 1000 77
New material confirmation 168 77
Monthly reliability monitoring 168 22
  • Test Type:Environmental Stress verification 
  • Test Purpose:Verify the sealing and moisture resistance of the product plastic seal
  • Test reference standard: JESD22-A101
  • Test Conditions:Ta: 85±2℃,RH: 85±5% 
  • Test equipment:Programmable Constant Temperature and Humidity Chamber
09
Temperature Cycling Test
温度循环测试.png
Testing Time(Plan) Testing Cycles(H) Sample QTY(PCS)
New product development 1000 77*3 (According to AEC-Q101)
Annual test 1000 77
New material confirmation 1000 77
Monthly reliability monitoring 100 22
  • Test Type:Environmental (temperature) stress verification
  • Test Purpose:Verify the resistance of exposure to alternating extremes of high and low temperatures
  • Test reference standard:JESD22-A104C 、AEC-Q101、GB/T2423.22
  • Test Conditions:(air to air)Ta=-55℃ 30min-----+150℃30min  (Conversion time 1 minute)
  • Test equipment:BOYI Temperature Cycling Test Chambers
10
Solder Heat Resistance Test/ Solderability Test
耐焊接热试验可焊性试验.png
Testing Time(Plan) Testing Cycles(S) Sample QTY(PCS)
New product development 10+2/0S /5±1S 10*1 (According to AEC-Q101)
Annual test 10+2/0S /5±1S 22
New material confirmation 10+2/0S /5±1S 22
Monthly reliability monitoring 10+2/0S /5±1S 22
  • Test Type:Environmental Stress verification/Solder property verification 
  • Test Purpose:Verify product resistance to welding thermal shock/tin loading
  • Test reference standard:GB/T4937.20-2012 /JESD22-B102D
  • Test Conditions:Liquid tin temperature:260℃±5℃,10+2/-0 S  /   TA=245℃±3℃,T=5±1S
  • Test equipment:   Electric Digital constant temperature tin melting Furnace
11
Pressure Cooker Test
高温高压高湿试验测试.png
Testing Time(Plan) Testing Cycles(S) Sample QTY(PCS)
New product development 96 77*3 (According to AEC-Q101)
Annual test 96 77
New material confirmation 96 77
Monthly reliability monitoring 96 22
  • Test Type:Environmental Stress verification 
  • Test Purpose:Verify product packaging tightness and moisture resistance
  • Test reference standard:JESD22-A108
  • Test Conditions:Pressure:2.07kg/cm2,Temp:121℃,Humidity:100%
  • Test equipment:   PCT Pressure Cooker Test
"Intelligent manufacturing" quality: As one of the core elements of competitiveness, quality should cover the entire product life-cycle from the production and development of products, delivery to subsequent related services.